Wang, Li-C. (2018). An Autonomous System View To Apply Machine Learning. 1-10. 10.1109/TEST .2018
Wang, Li-C. (2016). Experience of Data Analytics in EDA and Test - Principles, Promises, and Challenges. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. PP. 1-1. 10.1109/TCAD.2016.
Wang, Li-C. Chapter 1 Learning from Limited Data in VLSI CAD. (2018).
Shan Jay, Wahba Ahmed, Wang Li-C, Sumikawa Nik. (2019). Deploying A Machine Learning Solution As A Surrogate. IEEE International Test Conference, 10 pages
Tikkanen, Jeff & Siatkowski, Sebastian & Sumikawa, Nik & Wang, Li-C & Abadir, Magdy. (2014). Yield Optimization Using Advanced Statistical Correlation Methods. 1-10. 10.1109/TEST.2014.
L. Wang, S. Siatkowski, C. Shan, M. Nero, N. Sumikawa and L. Winemberg, Some Considerations on Choosing An Outlier Method for Automotive Product Lines, 2017 IEEE International Test Conference (ITC), Fort Worth, TX, 2017, pp. 1-10.