|
Projects |
|
Analysis and Physical Design for Power-Gating
Technique |
|
With continuous shrinking of the minimal feature size, lowering
of supply voltages, and lowering of threshold voltages, leakage power is
emerging as a major challenge for current and future CMOS designs. Power-gating
is an efficient technique for reducing leakage power by shutting off the idle
blocks. However, the presence of power-gating may also introduce negative
effects on the circuits, which are not considered in the earlier design
stages. Ignoring those effects may result in suboptimal designs, and
potentially, even nullify the intended power savings. This research targets
to address those effects in several physical design stages, including power/ground
network design, floorplan, block scheduling, and try to find the optimal solution
of those designs when considering the power-gating technique. |
|
Delay Fault
Diagnosis for Non-Robust Test |
|
With feature sizes steadily shrinking, manufacturing defects
and parameter variations often cause design timing failures. It is essential
that those errors be correctly and quickly diagnosed. The existing delay-fault
diagnosis algorithms cannot identify the delay faults that require nonrobust tests,
because they ignore non-robust propagation conditions while emulating the
failure analyzer’s behavior. We propose a novel approach to perform
delay-fault diagnosis for robust and non-robust tests. The experimental results
show that our approach can diagnose delay faults with good resolution. It is
stable with respect to delay variations that the failure analyzer might
experience. |
|
Delay Fault
Diagnosis in Presence of Crosstalk for Nanometer Technology |
|
Crosstalk
coupling is one of the causes of design timing failures. It is essential
that timing failures be correctly and quickly diagnosed. We present a
methodology to diagnose the delay-defect in presence of crosstalk, given the physical
information such as crosstalk coupling capacitance, neighborhood information
and SDF delay information. |
|
Power Aware Physical
Design |
|
The advancement
in silicon process technologies offer smaller transistors and higher packaging
density but suffer from increased power consumption. Several techniques have
been deployed in order to lower power consumption and control
leakage currents. One of the design techniques applied is power-gating which saves power by
turning off inactive blocks which further complicates the analysis and
verification of physical power integrity. This research focuses on power
verification and optimization solutions for power/ground network with
accurate analysis on voltage drop (IR) and electromigration effects when power-gating
technique is applied. |
|
The Neighboring
Pattern-Insensitive Cell Library Design |
|
In this work we
develop the new cell library design style whose delays are insensitive to the
surrounding polysilicon patterns. |
|
Modeling the
Systematic Layout Pattern-Dependent Delay Variations |
|
In this work we
investigate the effect which the surrounding patterns of a polysilicon
gate’s channel have on its dimensions, on transistor’s delay, and
on leakage current. |
|
A dynamic-logic
timing model subject to process-variation effect |
|
After finishing
the static CMOS gate timing model considering process variations, all
possible noises and multi-input switching cases, we plan to use a similar method
to characterize the switching phenomenon in the dynamic logic circuits. |
|
Logic and Layout
Synthesis for Engineering Change Orders (ECOs) |
|
ECOs are
usually intended to address errors found in the logic during debugging or to
facilitate changes made to the design specification to compensate for design
problems that are introduced while integrating components of the system
design. As a project nears completion, a significant amount of time has
already been invested in making the original design efficient and
functionally verifiable; therefore, it is important that ECO changes be
confined to specific parts of the design, and to have minimal impact on
unrelated parts of the design. Recently, due to the dramatic increase in the
price of a mask set, a designer may randomly insert spare gates scattering
inside a design so that when a re-implementation is required, the new
implementation may also be achieved by using spare gates. Our research is focused
on addressing changes caused by Engineering Change Orders in logic and layout
synthesis methodologies. |
|
Pre-layout Global Net Prediction Techniques |
|
Based on
studies performed on numerous placed netlists, we have observed that long
nets are not produced randomly by placers, but to some degree are
predetermined by the netlist structures. IBM benchmarks run without
pre-placed pads produced almost the same set of long nets on different
placers. This experiment suggests that long nets can be predicted before
placement. Which nets end up long depends on a large extent on netlist
structure. Our research is targeted to develop such pre-layout long-wire
prediction techniques. |