University of California, Santa Barbara
Department of Electrical and Computer Engineering

VLSI Project Testing

ECE224B - Spring 2007

Instructor: Professor Patrick Yue

Schedule:MW 3:00-4:30 PM (ESB 1003)

Course Information:

This class will utilize commercially available mixed-signal ICs to elucidate how to perform bench testing to validate the performance specifications listed in the datasheet provided by the manufacturer. In particular, the class will focus on testing several analog-to-digital and digital-to-analog converters. If time permits, a fully integrated radio-frequency phase-locked loop (PLL) IC will also be tested.
To provide the essential background for the testing assignments, the lectures will cover the following topics in details:

(1) understanding the datasheet of a data converter IC,
(2) fundamental of sampled systems,
(3) data converter specifications,
(4) data converter architectures,
(5) testing techniques for data converters, and
(6) test board design issues and interface circuit requirements.

From this course, the students will acquire in-depth knowledge for data converter performance specifications, design trade-off of different converter architectures, and hands-on experience of testing off-the-shelf data converters.

Course Syllabus

Lecture Notes and Slides from
The Data Conversion Handbook, edited by Walt Kester, Analog Devices Inc. (Newnes, 2005)

Eval board & Datasheet from National Semiconductor

Homeworks

 

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Last Updated: April 10, 2007